Best Paper Awards

Enabling Virtual Scope capability on the V93000​

Bernhard Moessler – Infineon
Jubal Saji, Souvik Dey – Advantest​

 

Early detection of CRES degradation on High Current Power Planes

Brent Bullock – Advantest

 

Honorable Mentions

Improving Efficiency and Robustness of Gaussian Process Based Outlier Detection via Ensemble Learning

Makoto Eiki – Sony Semiconductor Manufacturing Corporation

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Boost the Performance of the Test Program Development through Burst And Concurrency on Smartest8

Jun Zhang, Bowen Yang, Jiamin Wang – Advantest

 

Best Kiosk Award

Advantest Talks Semi

Nadine Schill, Keith Schaub – Advantest

 

Visionary Award

Matt Silverstein – Analog Devices