Best Paper Awards

New ATE Testing Techniques Using PCl-Express with Link Scale-PCle to Solve Scan, Structural Protocol and Third-Party Integration Challenges

Brendan Tully – Amazon
Mike Kozma – Advantest

Migrating the Test of Medium Power Mainstream SOC Devices Using UHC4T/DPS128 to Single XPS256 DPS Solution

Stefan Walther – Advantest
Linda Hänel – Advantest

Honorable Mentions

Screen Outliers with Adaptive Test Points to Improve Quality and Reliability

Ram Mowdhgalya Mani – AMD
Gabriel Tellechea – AMD

S-Parameter Capability on the V93000 for Millimeter Wave Devices 

Oscar Solano Jimenez – Advantest
Satoshi Tatematsu – Advantest

Best Kiosk Award

ACS Edge 2.0 and Application Store 

Sonny Banwari – Advantest

Visionary Award

Gabriel Tellechea – AMD