Technical Program

VOICE 2017 Papers for Palm Springs

Download the Technical Program Agenda for Palm Springs

*Note: The Technical Program information and schedule are subject to change.

Device-Specific Testing

V93000-27-DST - A Calibration Procedure for the UDI 77-GHz Stimulus

Andy Nguyen, NXP; Windter Pan, Advantest

Room Ironwood - 2:20 PM Wednesday


Testing a radar receiver requires sourcing an accurate signal. This paper covers hardware set-up and software coding to calibrate the entire dynamic range of the HB source with a power meter along with the UDI’s own mixer. Verification is demonstrated on the actual radar receiver for characterizing the conversion gain.

V93000-77-DST - Extending the TMU to Solve Linearity Measurement Challenges on a Precision PWM

Xin Li, Analog Devices

Room Ocotillo - 12:00 PM Tuesday

The V93000 timing measurement unit (TMU) is used to solve picosecond linearity measurement challenges on a precision PWM. This paper discusses the TMU test method code extensions used to extract raw data, accumulate distributions and calculate critical pulse width linearity characteristics.

V93000-86-DST - Introduce Fast Eye Mask Detection to Reduce the Test Time of High-Speed Transmitter Characterization

Simon Chu, Rod Lin, Sam Huang, W.S. Chou and Nancy Xu, Diodes Inc.; Matt Chen, Summer Chen, Advantest

Room Agave - 2:20 PM Wednesday


PRBS7 can be used to detect the eye mask and base on the searched eye center and eye height to redefine the searching region for PRBS15 and PRBS23. The authors integrated fast eye mask detection with a smart embedded search and applied this new method to a HDMI 2.0 ReTimer device.

Other Advantest Platforms-133-DST - CloudTesting Service Adoption in Qualcomm

A.T. Sivaram and Yasuji Oyama, Advantest; Kedar Gharat and Sam El Alam, Qualcomm

Room Ironwood - 11:15 AM Tuesday


Nanometer technology has led to a drastic increase in operational frequencies of semiconductor circuits. Consequently the performance of circuits has become more vulnerable to delay variation. Using an off-the-shelf programmable clock generator on the performance board, the CloudTesting Service meets all the requirements of transition-delay fault testing.

 

T2000-134-DST - Test Solutions on T2000 IPS for a HSIF with LVDS Transmitter-Receiver in an Automotive Product

Marc De Cooman, ON Semiconductor

Room Agave - 11:15 AM Tuesday

The specifications of a high-speed serial interface in an automotive product are a challenge for testing on ATE. The author presents solutions involving DFT that provide sufficient test coverage to meet high-quality requirements.

V93000-157-DST - OOB Test Solution in HSIO

Xin Li, Zhengwei Mi, Yanfen Fang, Xurong Cao and Li Zhang, Advantest

Room Agave - 3:05 PM Wednesday


SATA/SAS protocol is being utilized more frequently with the development of the SerDes industry, making test requirements for OOB much stronger than before. This paper introduces a test solution for OOB that combines the V93000 PSSL digital card’s abilities with normal tolerance testing in SerDes.

Other Advantest Platforms-163-DST - Solutions for IoT (Internet of Things) Modules by EVA 100

Shin Kimura, Satoshi Takahashi, Takeshi Nagasaka and Takao Seki, Advantest

Room Ironwood - 12:00 PM Tuesday


As an IoT solution, the EVA100 tester can perform system-level testing of modules. Major new functions allow external access requests regarding IoT module data, internal sensor emulation, easy connection functions with external measuring instruments and correspondence to automotive IF protocols, which is indispensable for evaluating automotive devices.

 

T2000-202-DST - ADC and DAC Testing with GPWGD for STMicroelectronics’ MCD Microcontroller Devices

Philippe Cavallera and Amine Ltaief, STMicroelectronics; Simondavide Tritto and Kenji Nishi, Advantest

Room Agave - 12:00 PM Tuesday


Along with RF front-end modules, microcontrollers are becoming the core IP for IoT applications. They embed different analog IPs such as ADCs and DACs, OpAmps and comparators for interfacing with sensors. Most of the time, the performance of ADCs and DACs is guaranteed by design and only a low-level, quasi-static test is performed in production, leaving full IP validation to a characterization stage.

 

Hardware Design & Integration

Platform Independent-46-HDI - A Unique Way to Evaluate a Complete Signal Path for 20+ Gbps Loopback Test in High-Volume Production

Derek Lee, nVidia

Room Ironwood - 2:55 PM Tuesday


As data rates go up, the signal path in the loopback test becomes critical. The channel has to be right, not too long and not too short. There is the right amount of loss and ISI. PCB traces can easily be modeled/simulated, but the socket is not as simple. A test fixture has been created to evaluate the entire channel.

V93000-105-HDI - Test Temperature Control System on Pin Scale 1600 Implemented by the Automotive Area

Chun Yang, Advantest

Room Ironwood - 2:55 PM Tuesday


This paper discusses a test system that economically provides an extremely low-temperature environment for automotive devices based on the Pin Scale 1600 without adding extra test equipment or cost.

Platform Independent-129-HDI - Enlightened Power Integrity for Loadboards and Probe Cards

Don Thompson, Sandeep Sankararaman and Shakeel Siddiqui, R&D Altanova

Room Ironwood - 4:00 PM Tuesday


The authors present an overview of power integrity methodology for ATE boards that covers key issues from theory to simulation to measurements.

Platform Independent-130-HDI - 80+ GHz Low-Loss Transmission from Tester to DUT

Sandeep Sankararaman, Don Thompson and Shakeel Siddiqui, R&D Altanova

Room Ironwood - 4:45 PM


A low-loss, lower cost-of-test method of transmitting 80+ GHz signals from tester to DUT in a PCB is presented.

V93000-161-HDI - V93000 Loadboard Checker Library

Jie Bao and Kang Hu, Advantest

Room Ironwood - 11:15 AM Tuesday


Loadboard checker is a test program to check the loadboard components before production. As the number of sites increases, this kind of test by ATE is more efficient and provides better coverage. This paper introduces a test program library for the V93000 system that can enhance the loadboard checker program’s development efficiency.

T2000-176-HDI - Use of Two Low-Cost Hardware Concepts to Speed Up the Test Development Cycle on T2000 IPS

Steven De Leenheer, ON Semiconductor

Room Agave - 2:10 PM Tuesday


One concept allows fast, low-cost hardware preparation and flexible multi-user development of test programs. It uses a motherboard and double daughterboard combination to gather statistical data via device handler testing. A second concept provides a flexible way to debug a wafer test solution by using a packaged device and avoiding a probe set-up.

Production Test Cell-199-HDI - Handling Solution for Stack Memory: M6245 with Active Thermal Control and Visual Alignment

Zain Abadin and Takayuki Shigihara, Advantest

Room Ironwood - 11:20 AM Wednesday


Advantest’s new M6245 memory handler is the first of its kind, providing superior temperature control, positioning accuracy and high throughput that are ideal for testing today’s double data rate (DDR) and Flash memory ICs. This paper explains the benefits of applying the M6245 in final testing.

Hot Topics

V93000-22-HT - Mixed-Signal Testing with Wave Scale MX

Stefan Gross, Advantest

Room Date Palm - 12:00 PM Tuesday


The Wave Scale generation of analog instruments has a totally new architecture, synchronization mechanism and user interface. This paper discusses the set-up parameters, instrument performance and the benefits of the new features. It also explains the technologies used inside and how the signal quality and execution performance can be optimized.

V93000-32-HT - Parallel RX and Duplex Testing for Improving Test Coverage and Test Time

Martin Hua, Hao Chen, Frank Goh, Oscar Solano and Ping Ge, Advantest; Javier Medina and Phong Pham, Spreadtrum

Room Date Palm - 2:10 PM Tuesday


With independent AWG and DGT resources, the Wave Scale RF card makes it possible to test LTE RF transceivers in duplex and parallel RX modes. Benefits include shorter test times and improved coverage.

V93000-31-HT - DigRF LTE-A Transceiver Test Program Migration From SmarTest7 Port Scale RF to SmarTest8 Wave Scale RF

Martin Hua and Hao Chen, Advantest; Javier Medina and Phong Pham, Spreadtrum

Room Kachina - 12:00 PM Tuesday


DigRF LTE-A devices are inherently complex with their multi-port, multi-band, MIMO and carrier aggregation requirements. This paper describes the migration process and challenges of converting this type of transceiver from SmarTest7/Port Scale RF to SmarTest8/Wave Scale RF. Results of the conversion are provided.

V93000-64-HT - IoT and the V93000: Superior Cost of Test Through Advanced System Architecture and Test Methodology

Jonvyn Wongso, Microchip   

Room Nopales - 2:10 PM Tuesday


Testing IoT devices can be very cost sensitive. For devices ranging from digital to mixed-signal to RF circuits, test requirements include the highest parallelism and minimal test time. This presentation describes various methodologies for testing transceivers, SoCs and SiPs of Bluetooth, Zigbee and Wifi devices on the V93000.

V93000-67-HT - V93000 Interface Tool for Fast and Easy Pattern Bring-Up and Design Validation

Jinlei Liu, Liang Ge and Rita Lu, Advantest

Room Joshua Tree - 12:00 PM, Room Nopales - 12:00 PM Tuesday


This paper describes a new Advantest tool to interface between the design environment and the V93000 platform, enabling fast and easy validating and debugging of patterns and set-ups. It improves productivity and efficiency from simulation, validation, characterization, bring-up, production and FA.

V93000-81-HT - V93000 Spike Checking with Higher Efficiency and Better Coverage

Kai Kang, Jincheng Zhang, Lydia Jiang, Dynax Chen and Thomas Shi, Advantest

Room Joshua Tree - 11:15 AM, Room Nopales - 11:15 AM Tuesday


Spike check is important for program quality control. This paper introduces an automatic solution for fast spike checking on the V93000 platform. The method can improve test quality by finding spikes caused by failed devices and incorrect power up/down sequences.

V93000-96-HT - Using AVI64’s New Features to Meet the Test Challenges of Automotive Devices

Henry Fu, NXP; Kai Kang, Lydia Jiang, Daniel Spann, Peng Wang, Advantest

Room Nopales - 2:55 PM Tuesday


As part of the V93000  solution, the AVI64 card has several new features for testing automotive devices. Capabilities include 400 uV modulation voltage testing, propagation delay tests at the nanosecond level that touch hardware specification limits, an HCU application as a floating resource to test Rdson and dynamic set-up of TMU thresholds per site by RDI.

V93000-110-HT - Testing Automotive Airbag System Devices on the V93000

Room Nopales - 4:00 PM Tuesday


Zhaoyang Wang, NXP; Lydia Jiang, Kai Kang, Qiannan Ren and Peng Wang, Advantest

The airbag electronic control unit (ECU) device is the core part of the passive safety system. This paper introduces an automotive airbag device test solution using AVI64, PVI8 and PMUX hardware features to achieve the highest accuracy, faster test times and a 4X improvement in parallel testing.

V93000-124-HT - Case Study of an 8-Site LTE-A RF Transceiver Conversion from SmarTest7 Port Scale RF to SmarTest8 Wave Scale RF

Frank Goh, Yun Dai, Ping Ge, Wenjing Song and Oscar Solano
, Advantest

Room Date Palm - 2:55 PM Tuesday


This paper explains the process of converting an 8-site LTE-A RF transceiver device from SmarTest7 using Port Scale RF to SmarTest8 using Wave Scale RF. The challenges include pattern and Dynamic-to-Static D2S conversions, RF set-ups and hardware triggers in SmarTest7 and SmarTest8. Correlation and test time results will be shared.

V93000-204-HT - Introduction to SmarTest 8 and Wave Scale

Michael Braun, Advantest

This paper explains the basics of SmarTest 8 including the instrument concept, set-up elements, test program structure, debugging and result tools. It provides a general introduction to the new and unified use model across digital, DC, mixed-signal and RF testing.

Improving Throughput

T2000-20-IT - Using Edge Shift to Measure Pin-to-Pin Performance in a Multi-Site Environment

Rick Dudley, Xilinx

Room Agave - 2:55 PM Tuesday


Using the built-in edge shift capability of the T2000 tester to characterize pin-to-pin performance can quickly determine results and easily scale for multi-site testing with low overhead for each additional site tested.

V93000-29-IT - Power Supply Alarm Root Cause Isolation

Rudy Gabuco, Advantest

Room Joshua Tree - 4:00 PM Tuesday


The paper presents a case study of a new device bring up in which an alarm from a UHC4 power supply led to low yield. Identifying the root cause of the power supply alarm can be a valuable learning experience for engineers with different DPS debugging scenarios.

V93000-34-IT - Pattern Conversion: Standardizing the Process and Reducing STIL Conversion Times

Adam Kohler, AMD; Steve Elenniss, Advantest

Room Joshua Tree - 11:20 AM Wednesday


Standardizing to a single wavetable across all content development groups has many advantages and one disadvantage: longer conversion times. This paper offers a solution that can decrease STIL conversion times by over 90 percent.

V93000-35-IT - ProgCheck: An Error Catching, Pre-Program Loading and Path Validation Tool

Andrew Balash, AMD; Steve Elenniss, Advantest

Room Joshua Tree - 10:35 AM Wednesday


ProgCheck is a tool for performing basic error checking and analysis without doing a program load. It can find pattern and burst usage and then ensure the labels and files are properly defined and exist. Outputs include used and unused pattern lists, a full list of missing patterns and tests that reference undefined bursts.

T2000-49-IT - Successful Concurrent Test Solution by T2000 IPS

Room Agave - 4:00 PM Tuesday


Weiqiang Yang and Jinchual Kim, Advantest

Concurrent test is always complex, which also depends on internal device interaction and power  supplies.  The authors discuss a concurrent test solution for power devices using the T2000 IPS system.  This paper will introduce the concept, board design and base requirements for pin assignment and test methodologies.

V93000-84-IT - Best Throughput Practices for Active Run-Time Pattern Modification on V93000

Liqiao hu, Yinggao Xia, Jun Zhang and Liang Ge, Advantest

Room Joshua Tree - 4:45 PM Tuesday


In cases such as trim or OTP, pattern content to execute is determined in run time. There are different approaches in SmarTest to change the pattern content in run time. Throughput can depend on the site count, data size, download action number and program structure.

V93000-108-IT - “Immediate Upload” Further Improving Digital Capture Test Throughput

Jun Zhang, Yinggao Xia and Liang Ge, Advantest

Room Joshua Tree - 1:35 PM Wednesday


Maximum throughput and multi-site efficiency on the V93000 can be achieved with SmartCalc, which can hide data uploads and calculations behind other tests. In cases where SmartCalc cannot be applied, a new “immediate upload” feature can close the performance gap. This paper introduces and analyzes the use of immediate upload.

V93000-111-IT - V93000: Improved Throughput Through DCSIGNALs

Daniel Grzeda, Texas Instruments; Christopher Green, Advantest

Room Joshua Tree - 11:15 AM Tuesday


For ICs with a large number of digital pins being tested on the V93000 platform, care can be taken to increase the site count by converting digital pins that meet certain requirements to be resourced by a power supply instead of a digital resource. This has the potential to decrease test costs and increase throughput drastically.

V93000-114-IT - High Parallelism Probe Card on V93000 Direct Dock System to Increase Testing Throughput on Automotive

Johann Heitzer, Way Jam Chen and Norbert Effenberg, Infineon; Alexander Züendorf and Peter Hirschmann, Advantest; Alan Liao and Patrick Phipps, FormFactor

Room Kachina - 12:00 PM Tuesday


As automotive IC fabrication transitions to sub-40nm processes on 12-inch wafers, customers are exploring more efficient test solutions to accommodate the increased number of die per wafer. FormFactor and Advantest have collaborated to develop FFI TrueScale Matrix products on the V93000 direct dock system to enable parallel testing of up to 128 DUTs over a 170C temperature range.

T2000-120-IT - Test Condition Run-Time Optimizer for Test Time Reduction

Yasutoshi Muramatsu, Advantest

Room Agave - 4:45 PM Tuesday


The test condition optimizer, a new feature supported on TSS R3.07_00 or later, allows users to automatically skip redundant test condition settings and redundant delay statements defined in level block without any program modifications. This paper explains how this feature works and presents a verification result using an actual device program.

V93000-158-IT - Inertial Sensor Test on V93000

Sven Lotterer, Bosch

Room Joshua Tree - 2:10 PM Tuesday


Final testing of MEMS is a very special branch of IC testing, normally involving special handlers, high site counts and special test processes. This paper shows how to bring MEMS inertial sensor ICs to high-volume manufacturing including testing specifics and the test-time reduction steps used to meet production requirements.

V93000-178-IT - Test Cost Reduction: How Low Can We Go?

Bob Bartlett, Advantest

Room Joshua Tree - 2:55 PM Tuesday


Semiconductor testing processes are not just technologies; they are part of a company’s management strategies. This paper examines V93000 systems to understand the relationship between costs and various test node insertions, including a look at test cost reduction strategies and the impact of system-level test (SLT) on semiconductor testing processes.

Product Engineering

Platform Independent-19-PE - Git: Distributed Revision Control System

Ronald Goerke, Advantest

Room Ironwood - 10:35 AM Wednesday


Git, a version control system similar to Subversion, is typically used during test program development. This paper introduces the tool and discusses the main differences between it and Subversion.

V93000-28-PE - GPIB Analyzer

Leonard Cheng, Advantest; Cola Huang, Terapower Technology Inc.

Room Nopales - 10:35 AM Wednesday


A GPIB connection is crucial for mass production, but users have encountered GPIB connection problems such as hang-up and time-out issues. Although the V93000 provides a GPIB log, it can take clients a good deal of time to analyze it manually. This tool can help with the analysis and make it easier to identify root causes.

V93000-63-PE - Automatic Calibration File Selector

Leonard Cheng, Advantest; T.K. Tseng, Amkor

Room Nopales - 11:20 AM Wednesday


A calibration file, which is crucial whenever a test is in progress, contains all of the calibration data. Using the wrong version of SmarTest can cause device failures or low yields. But using this tool can help clients to select the right calibration file automatically, avoiding human error.

V93000-65-PE - Switch Test Condition for Custom Part Number and Process by Recipe File

Akihiro Sasano and Gary Kinoshita, Advantest; Reza Saidi, Integrated Device Technology

Room Nopales - 1:35 PM Wednesday


Customizing devices by the customer is common for SoCs, but multiple test flows are needed for the same family of products. The recipe file containing the test conditions, such as part numbers and processes, provides flexibility for the test flow and reduces the cost of maintenance. This paper shows how to add recipe files without an application model.

V93000-155-PE - A Test Program Integrity Assurance for Outsourcing

Boon Kok Lau, Tian Sze Lee and Kheng How Tan, Advantest; Leon Yeow Ting and Kar Leong Foong, Qualcomm

Room Nopales - 2:20 PM Wednesday


In an outsource business model, a test program release process involves engineers from different companies. To ensure that the test program in production remains the true copy as released, a test program integrity process is needed. This paper describes how to implement this, which greatly improves cross-functional collaboration and reduces the chances of misprocessing.

V93000-159-PE - V93000 Pattern Generator for SmartRDI

Dong-Myong Kim, Bernd Reiter and Rose Hu, Advantest

Room Nopales - 3:05 PM Wednesday


ATE systems’ ability to balance flexibility in engineering and stability in production is very important. This paper introduces a new customized tool that generates a production program package, including all SmartRDI patterns required, from an engineering test program.

V93000-170-PE - PE Tools

Wei Leong Ee, Advantest

Room Nopales - 4:45 PM Tuesday


PE Tools is a web tool designed to assist product engineers in their daily work, including setting up test programs, generating model files, writing test method code and debugging. If the user encounters any problems with the set-up files, Advantest experts can assist by logging in to the web tool from anywhere in the world.

New Hardware/Software Test Solutions

V93000-25-NTS - Instant Power Changes to Dramatically Reduce Test Time with Wave Scale RF

Oscar Solano Jimenez and Jason Smith, Advantest

Room Date Palm - 4:00 PM Tuesday


RF power changes cost a significant amount of test time, but are needed in many tests. This paper introduces a new feature for Wave Scale RF called power reduction that reduces power changes from approximately 600 microseconds to less than 1 microsecond. Testing of power servos can be optimized with this feature.

V93000-39-NTS - A New BBIQ Calibration Solution for Both V93000 MBAV8 4S4M Card and 8M Card

Yongjun Hu, Frank Goh, Simon Wang, Hagen Goller, Alfred Rosenkraenzer and Martin Ingolf, Advantest

Room Kachina - 11:15 AM Tuesday


Currently, the V93000 BBIQ calibration solution supports only the MBAV8 4S4M card. This paper presents a new solution that supports both the MBAV8 4S4M card and the MBAV8 8M card with one new calibration loadboard.

T2000-40-NTS - ST MDG MCD Current Sensor Trimming and Characterization Using T2000 PMU32 VI

Matteo Cercone, Advantest

Room Agave - 10:35 AM Wednesday


This paper demonstrates how the T2000 PMU32 VI system can improve throughput and accuracy in trimming a current sensor. The cited test case applies to a ST MCD microcontroller.

T2000-54-NTS - The Challenges of Testing IoT Modules on T2000 AiR

Jeongseob Kim, Koji Miyauchi, Tomoyuki Itakura and Jonghyun Cho, Advantest

Room Agave - 11:20 AM Wednesday


This paper shows a test solution for IoT modules that uses parametric testing while the devices are working on their own OS. With the T2000 AiR system, system-level testing and ATE-based testing can be performed at the same time.

V93000-56-NTS - How to Make Use of AVI64 with High Efficiency in Power and Analog Testing

Siyuan Geng, Advantest

Room Kachina - 4:00 PM Tuesday


The V93000 AVI64 has many features that are useful for power and analog testing, especially for automotive ICs. This presentation reviews the latest improvements and explains how to use them most efficiently to shorten time to market and increase throughput in production.

V93000-66-NTS - V93000 32 Gbps High-Speed Extension Solution to Test High-End GPU

Jinlei Liu, Jinglan Jia and Takatoshi Yoshino, Advantest; Derek Lee, nVidia

Room Kachina - 4:45 PM Tuesday


The V93000 32 Gbps high-speed extension solution, based on the V93000 16 Gbps PSSL digital card, uses Advantest’s universal device interface (UDI) to boost the data rate up to 32 Gbps. For testing state-of-the-art GPU devices, multiple high-speed interfaces are integrated into a single package. This paper describes some key test items using this approach.

V93000-68-NTS - PSSL for Display Port TX Characterization

Lokesh Narayan, nVidia; Jinlei Liu, Advantest

Characterizing a display port transmitter at HBR3 speed pushes the bandwidth limit of the Pin Scale 9G card. At 8.1 Gbps, the eye captured is significantly smaller and can’t be correlated to bench measurement results. With the PSSL card and DNA tool, the captured eye is comparable to bench measurements so ATE can be used for characterizing large volumes of devices.

V93000-98-NTS - Learnings and Highlights in SmarTest 8 for a Leading Edge Application Processor

Richa Virmani, Qualcomm; Helmut Schmid, Kheng How Tan, Tobias Eipperle and Michael J. Richter, Advantest

Room Date Palm - 4:45 PM Tuesday


A leading edge application processor  was converted from SmarTest7 to SmarTest8. This presentation shares what was learned from the conversion with the SmarTest migration framework and the experience with the new modular block structure. Some highlights in SmarTest8 will be shown.

V93000-131-NTS - Universal Device Interface (UDI) RF Test Solution: 60 GHz Over the Air

Alex Gurtovnik, Qualcomm; Margarete Huang and Oren Snir, Advantest

Room Kachina - 11:20 AM Wednesday


A universal device interface (UDI) was evaluated as a 60-GHz over-the-air (OTA) test solution for Qualcomm’s Sparrow-R radio device. First a RF DUT was coupled with Qualcomm’s BB device Sparrow-M to provide LO (7.5 GHz) and IF (15 GHz) frequencies, then a Port Scale RF tester and an external signal generator were used instead of a baseband device.

V93000-143-NTS - A Programming Framework of Multi-Lane SerDes Device Test Solution Based on D2S Protocol Aware

Yanfen Fang, Xin Li and Xurong Cao, Advantest

Room Kachina - 1:35 PM Wednesday


In a multi-lane SerDes test solution, all device settings and most of test results are realized by Dynamic-to-Static D2S protocol aware. Test items are duplicated on a set of SerDes TX-RX lanes. This makes the test program huge and complex. This paper describes a better programming framework and how users can benefit from it.

V93000-144-NTS - High-Speed SerDes At-Speed Testing Application

Room Kachina - 2:20 PM Wednesday


YeQing Wang, Zhang Li and Yanfen Fang, Advantest

To improve test coverage for high-speed SerDes, at-speed testing is needed. For SerDes exceeding 16 Gbps, there are additional challenges. This paper presents a case study using UDI for at-speed testing.

V93000-152-NTS - SerDes Technology and Test Solution

Cao Xurong, Fang Yanfen and Yeqing Wang, Advantest

Room Kachina - 2:10 PM Tuesday


Testing SerDes, the mainstream serial interface technique for big data rapid transferring, presents unique challenges. This paper introduces the total test solution applied on a 28-Gbps SerDes device including loadboard design highlights, UDI applications, test methodology and the test method library for ABIST and HSIO tests.

V93000-171-NTS - Quick Identification and Prevention of Harmful States in Test Program

Andreas Ruf and Thomas Shi, Advantest; Hari Prasad, Infineon Technologies

Room Kachina - 2:55 PM Tuesday


Advantest’s TP360 release checker tool helps to identify and prevent real and potentially harmful states in a test program. New enhancements support power instruments such as AVI64 and PVI8, pattern-based test programs and loadboard relays and PMUX.

V93000-181-NTS - Demodulation Tests in SmarTest7 and SmarTest8 (LTE, 802.11AX and More)

Edwin Lowery and Pablo Gonzalez Quijano, Advantest

Room Joshua Tree - 2:20 PM Wednesday


Advanced modulation formats require the use of a large number of input and output parameters to find EVM. Finding the correct stable input parameters can be a complicated task. This paper covers many new features in SmarTest 7 and SmarTest 8 that allow the tester to automatically find the best combination of input parameters to measure EVM.

V93000-183-NTS - Instrument Synchronization in SmarTest 8: RF to MX to DC to Digital

Edwin Lowery, Shiyang Deng and Aether Lee, Advantest

Room Date Palm - 11:20 AM Wednesday


SmarTest 8 provides a new interface for instrument synchronization. This operating sequence tool is intuitive and easy to use for complex SoC tests that cross test domains. However, having a deeper understanding of the new synchronization features in SmarTest 8 will help to ensure that the desired level of synchronization is achieved efficiently by the test implementation.

V93000-186-NTS - Understanding PMUX and AVI64 Best Practices

Duane Brown, Advantest; Warren Grantham and David Baird, NXP

Room Kachina - 10:35 AM Wednesday


The Power MUX (PMUX) was introduced with the PVI8 and can be used with the AVI64 and the DPS128 or Pin Scale 1600 channels. This paper shows some specific cases for PMIC devices. Learning and best practices are shared, including recommended strategies.

V93000-187-NTS - PSI5 and DSI3 Testing Strategy Using the AVI64

Duane Brown, Advantest

Room Kachina - 3:05 PM Wednesday


This paper augments and is a follow-up to the VOICE 2016 paper “ID34-Using AVI64 to Test PSI5 and DSI3 Interfaces.” Specific items discussed include DSI3 implementation and results, digital capture compared to PPMU digitizer, synchronous mode, and writes and reads implementation.

V93000-188-NTS - 802.11ax: Next-Generation WiFi Communications

Max Seminario, Advantest

Room Joshua Tree - 3:05 PM Wednesday


With the increasing demand for bandwidth from users and higher data rates, the IEEE 802.11ax is currently working on next-generation WiFi communication solutions that allow multiple users to occupy the same bandwidth while increasing throughput. Advantest has developed an easy-to-use, high-throughput demodulation routine for this on the V93000.

Other Advantest Platforms-196-NTS - The HA1000: A New Instrument to Meet New Needs of the Industry

Dave Armstrong, Advantest

Room Ironwood - 2:10 PM Tuesday


This presentation introduces a new instrument for the industry: the die-level tester. It enables testing of bare die just before assembly to catch faults that occur in thinning, dicing and bumping operations as well as thermally induced faults that are typically found only at the final test (package) level.

T2000-203-NTS - Generic Approach for DUT Protocol Management in OTPL for T2000 IPS

Ronny Vanhooren and Jakub Tiller, ON Semiconductor; Derek Wu, Advantest

Room Agave - 1:35 PM Wednesday


In mixed signal test program development, the programming of the internal registers by various standard or non-standard protocols to setup the device for an analog test is a major contributor of the total spent effort. Once a solution is in place, then the same analog block is reused in another device. In this paper, a methodology is presented which is implemented in the base class of the T2000 IPS test classes and allows to setup DUT for a specific analog test from the OTPL code.

 

Reducing Time to Market

V93000-26-RTTM - Introduction of a Web-Based Test Plan and Test Program Generation Tool
Tong Li, Enwei Zhong, Kun Yang and Cindy Zheng, Advantest

Room Ocotillo - 2:10 PM Tuesday


Advantest has worked with a customer to develop a web-based tool to generate a test program from a test plan. With the tool, engineers can do pattern conversion, test programming (DC and functional) and characterization program generation. This paper introduces the concept, design and features.

V93000-38-RTTM - Automatic V93000 Pattern Set-Up Solutions for Sensor ASIC Device Test

Pu Lei and Crystal Zheng, Advantest; Zhongxing Lu, Bosch

Room Ocotillo - 2:55 PM Tuesday


This paper introduces an automatic V93000 pattern set-up solution for testing sensor ASICs. Three methodologies are explained to address time-consuming set-ups, saving an estimated 30 percent of offline work.

V93000-47-RTTM - A Novel Automatic Test Program Generation System Based on Standardized Device Test Plan

Jimmy Sun and Zhiyuan Wang, Advantest

Room Ocotillo - 4:00 PM Tuesday


This paper introduces a novel, cloud-based automatic test program generation (ATPG) system that provides a standardized device test plan format for both DFT engineering and ATE production testing, built-in ATE optimized programming approaches and flexible and extendable tool interfaces for customization requests.

V93000-58-RTTM - New API for Generic Pattern Generation with Protocol Support and Lab/Bench Compatibility

Christian Rost, Advantest

Room Ocotillo - 4:45 PM Tuesday


The PatternDefiniton API is a tool to define pattern and protocol structures in a generic way. It can be easily adapted to create different output formats or create tools for customized input formats to align ATE program and bench.

V93000-79-RTTM - An Auto Spike/Wave Checker Tool on V93000

Thomas Shi, Kai Kang, Liang Ge, Dynax Chen and Lydia Jiang, Advantest

Room Ocotillo - 10:35 AM Wednesday


In automotive/power testing, spike checking is a very important step in program quality control to avoid potential risks. The traditional spike-checking approach of controlling the tester and verifying the result with an oscilloscope manually can take a very long time. This paper introduces a one-button automatic tool that quickly locates the spike, greatly improving the quality release process.

V93000-85-RTTM - Smart Control of a High Quantity of Loadboard Switches (Utility and PMUX)   

Jun Zhang, Bernd Reiter and Liang Ge, Advantest

Room Ocotillo - 11:20 AM Wednesday


The number of required switches on a loadboard increases for applications that combine complex devices, high site counts and expensive test resources required at many pins such as high-power channels. This paper introduces the usability enhancement for utility lines and PMUX and describes the guidelines for loadboard design and programming principles.

V93000-102-RTTM - Speeding Up Pattern Validation Process and Accelerating Time to Market

Carlos Chen and Rita Lu, Advantest

Room Ocotillo - 2:20 PM Wednesday


This paper introduces a technique for speeding up the pattern validation process and accelerating time to market for NPI projects.

V93000-125-RTTM - An Interactive Tool to Generate a Program for TP360 Apps from a Test Flow

Peter Chiu, Kelly Yang, Corey Liu and Abhishek Singh, nVidia

Room Ocotillo - 3:05 PM Wednesday


A GUI tool has been developed to regenerate the test program interactively and automatically on an actual test with target patterns in a test flow. This can shorten the time needed by test engineers to create an optimized test program and help DFT engineers to focus on target pattern verifications with V93000 TP360 customized applications.

V93000-142-RTTM - A New Script Language for Test Program Auto-Generation Tool Rapid Development

Yanfen Fang, Xin Li and Xurong Cao, Advantest

As test programs become more complex, development time is impacting time to market. Therefore, auto-generation of test programs is growing more important. A new script language based on Perl has been developed to make auto-generation of test programs easier and more efficient.

V93000-166-RTTM - Swift Development and Rapid Deployment of IP Libraries with SmarTest8

Bryan Gonzalez and Aether Lee, Advantest

Room Date Palm - 1:35 PM Wednesday


SOC devices are very complex, having multiple cores or domains. As a result, test programs have become very complex and increase test development time. SmarTest8 has a new set of APIs designed to enable fast time to market with competitive throughput while simplifying IP deployment.

V93000-193-RTTM - Flexible Parametric Shmoo Capability on SmarTest8 for Mixed-Signal/RF Device Characterizations

Jie Ren, Advantest

Room Date Palm - 2:20 PM Wednesday


Shmoo traditionally has been a powerful characterization tool for digital IC testing. On SmarTest 8, users can get shmoo plots based on parametric results. This makes shmoo an excellent candidate for RF/analog device characterization and data collection. Device stability validation can now be extended into the parametric measurement domain.

Test Methodologies

V93000-36-TM - Auto-Correlation Function: An Alternative to Test PRBSn Transmitter Device

My-Way Wang, Advantest

Room Pinon - 11:15 AM Tuesday


In mathematics, an auto-correlation function is the definition of pseudo random binary sequence (PRBS). Therefore, it is intuitive to verify the PRBS transmitter output signal by this mathematical manner. There is an API “DSP_CORREL()” of SmarTest that has the capability to calculate the correlation result of array data simply and precisely.

V93000-60-TM - Frequency Division Measurement Enables Parallelism for RF Testing Devices with Wave Scale RF

Oscar Solano Jimenez, Martin Hua, Shiyang Deng and Nico Eichhorn, Advantest

Room Date Palm - 3:05 PM Wednesday


Wave Scale RF has a unique feature that allows it to measure up to four non-frequency overlapping signals in one shot by the same RF resource. High multi-site or intra-site parallelism is achieved, which significantly decreases test times while increasing test coverage.

V93000-91-TM - Powerful Customized Characterization Tool for Device Release

Aowen Guan, Panfei Zhai and Yun Dai, Advantest

Room Pinon - 12:00 PM Tuesday


Characterization is very important for a customer’s device release, requiring time and personnel resources. For customized characterization, a test method library enables users to do shmoo, pin margin, Vmin-Vmax search and Fmax search with the V93000, saving dramatically on test time.

V93000-92-TM - New Test Approach for Traditional Output DC TM for Test Time Reduction

Arul Karthick Kumar and Dharmesh Joshi, Qualcomm

Room Pinon - 2:10 PM Tuesday


A new test approach using a pattern controller presents the same capabilities of the output DC test method, but with a significant test time savings of approximately 80 percent to 90 percent. Measurement results can be correlated with both approaches.

V93000-104-TM - Timing-Saving Technique with Loop Structure Replacing Shmoo Test

Chun Yang, Advantest

Room Pinon - 2:55 PM Tuesday


This paper introduces a timing-saving technique that utilizes loop structure to replace a shmoo test. The technique reduces test time by eliminating the need to frequently switch specification sets in shmoo tests.

V93000-116-TM - Current Profiling Solution Using UHC4 High-Speed Sampler with SmartRDI

Teja Adike, Advantest

Room Pinon - 4:00 PM Tuesday


Implementing current profiling using dynamic DC (test points in pattern) requires a certain amount of manual effort. This paper describes a complete solution for implementing current profiling at a high sampling rate with an automated set-up generation. The solution can handle various pattern lengths automatically.

V93000-128-TM - Capacitance Measurements with V93000: From Parallel Sensor Production to Loadboard Verify

Alexander Zuendorf and Jia-Min Wang, Advantest

Room Pinon - 4:45 PM Tuesday


Concepts for production capacity measurements of sensors and uC DUTs include using Pin Scale 1600_PPMU for precision DUT input capacity, conducting fast capacity measurements on all channels in parallel with Pin Scale 1600_Pload at MHz, performing parallel high multi-site capacity measurements on sensor devices with AV8, and using a loadboard verification and production checker of large VDD capacitors with DPS128.

V93000-137-TM - Test Method Self-Adapted Execution for Device Characterization and Automatic Control

Jiamin Wang, Advantest

Room Pinon - 10:35 AM Wednesday


This paper introduces a procedure, based on an existing test method, to automatically control and characterize a device from self-adapted execution. The use of an N-dimension parametric shmoo and test method execution in close loop regulation are demonstrated. Control modules such as linear, binary and PID with its user cases are presented.

V93000-148-TM - A Novel UDI Implementation of Jitter Separation and Eye Test with Coherent Sampling

Yeqing Wang, Kenichi Nagatani, Zhijian Yi,

Room Pinon - 11:20 AM Wednesday


On the V93000 platform, currently UDI is the exclusive solution for high-speed testing of devices with data rates higher than 16 Gbps. This presentation introduces a new implementation of jitter separation and eye test by coherent sampling with UDI.

V93000-160-TM - Test Solution of SerDes SSC

Xin Li, Yanfen Fang, Zhengwei Mi, Yeqing Wang and Li Zhang, Advantest

Room Pinon - 1:35 PM Wednesday


HSIO interface communication protocols such as PCIE and SAS adopt SSC function in important applications. This paper introduces a series of testing methods for HSIO SSC functions using the V93000. These methods dramatically improve SerDes testing coverage and balance test time for optimizing the output ratio.

V93000-179-TM - High-Speed ATPG Testing Using Statistical Multi-Shmoo Analysis

Sharat Musham, Rene Roldan and Sergio Mier, Qualcomm; Praveen Venkataramani, Advantest

Room Pinon - 2:20 PM Wednesday


Structural testing is the most important aspect of post-silicon validation and is a major contributor to test time. This paper describes a methodology to speed up ATPG testing using multiple scan edges, inter-relating their dependencies and applied statistics to find the optimal region of interest for improving the performance, thereby reducing test time.

V93000-195-TM - Contact Resistance Importance and Measurement Techniques

Dave Armstrong and Brent Bullock, Advantest

Room Pinon - 3:05 PM Wednesday


For years the industry has checked continuity in order to confirm solid contact to the DUT.  While this has proved effective, a continuity test provides no real visibility into the actual contact quality as it varies across a device interface.

 This presentation shows values and test methods for doing contact resistance measurements.

VOICE 2017 Papers for Shanghai

Device-Specific Testing

V93000-62-DST - Application Test Implementation in Class D Audio Amplifier

Kuanlin Chen, Jason Lu and Chi Liang Hsia, NXP

Intercontinental 4 - 4:15 PM Friday


This presentation demonstrates how to address three major challenges observed during implementation by using SmartRDI to create I2C multi-byte and I2S signal patterns as well as MSE improvements with Pin Scale 1600's PPMU and BADC to replace MBAV8 LF digitizers.

Hot Topics

V93000-32-HT - Parallel RX and Duplex Testing for Improving Test Coverage and Test Time

Martin Hua, Hao Chen, Frank Goh, Oscar Solano and Ping Ge, Advantest; Javier Medina and Phong Pham, Spreadtrum

Intercontinental 2 - 2:15 PM Friday


With independent AWG and DGT resources, the Wave Scale RF card makes it possible to test LTE RF transceivers in duplex and parallel RX modes. Benefits include shorter test times and improved coverage.

V93000-67-HT - V93000 Interface Tool for Fast and Easy Pattern Bring-up and Design Validation

Jinlei Liu, Liang Ge and Rita Lu, Advantest

Intercontinental 4 - 1:30 PM Friday


This paper describes a new Advantest tool to interface between the design environment and the V93000 platform, enabling fast and easy validating and debugging of patterns and set-ups. It improves productivity and efficiency in simulation, validation, characterization, bring-up, production and FA.

V93000-81-HT - V93000 Spike Checking with Higher Efficiency and Better Coverage

Kai Kang, Jincheng Zhang, Lydia Jiang, Dynax Chen and Thomas Shi, Advantest

Intercontinental 3 - 11:25 AM Friday


Spike check is important for program quality control. The paper introduces an automatic solution for fast spike checking on the V93000 platform. This method can improve test quality by finding spikes caused by failed devices and incorrect power up/down sequences.

V93000-96-HT - Using AVI64's New Features to Meet the Test Challenges of Automotive Devices

Henry Fu, NXP; Kai Kang, Lydia Jiang, Daniel Spann, Peng Wang, Advantest

Intercontinental 3 - 1:30 PM Friday


As part of the V93000 solution, the AVI64 card has several new features for testing automotive devices. Capabilities include 400 uV modulation voltage testing, propagation delay tests at the nanosecond level that touch hardware specification limits, an HCU application as a floating resource to test Rds-on, and dynamic set-up of TMU thresholds per site by RDI.

V93000-110-HT - Testing Automotive Airbag System Devices on the V93000

Zhaoyang Wang, NXP; Lydia Jiang, Kai Kang, Qiannan Ren and Peng Wang, Advantest

Intercontinental 3 - 2:15 PM Friday


The airbag electronic control unit (ECU) is the core part of the passive safety system. This paper introduces a test solution for automotive airbag devices using AVI64, PVI8 and PMUX hardware features to achieve the highest accuracy, faster test times and a 4X improvement in parallel testing.


V93000-124-HT - Case Study of an 8-Site LTE-A RF Transceiver Conversion from SmarTest7 Port Scale RF to SmarTest8 Wave Scale RF

Frank Goh, Yun Dai, Ping Ge, Wenjing Song and Oscar Solano , Advantest

Intercontinental 2 - 3:30 PM Friday


This paper explains the process of converting an 8-site LTE-A RF transceiver device from SmarTest7 using Port Scale RF to SmarTest8 using Wave Scale RF. The challenges include pattern and Dynamic-to-Static D2S conversions, RF set-ups and hardware triggers in SmarTest7 and SmarTest8. Correlation and test time results are shared.

Improving Throughput

T2000-49-IT - Successful Concurrent Test Solution by T2000 IPS

Weiqiang Yang and Jinchual Kim, Advantest

Intercontinental 1 - 1:30 PM Friday


The authors discuss a concurrent test solution for power devices using the T2000 IPS system.

V93000-72-IT - Replacing ATE Analog Modules with Digital Channels to Test Embedded ADC/DAC

Yong Li, Amlogic; Qixin Wei, Advantest

Intercontinental 2 - 1:30 PM Friday


Testing embedded ADCs/DACs in SoCs and detecting any defects early in the CP stage is vital to a low-cost solution. This paper presents a mass production case study that leveraged Pin Scale 1600's universal pin feature to replace LF AWG/DGT and test SARADC and DAC. SmartRDI was used to accelerate development time and achieve a standardized program.


 

V93000-76-IT - Test Efficiency Improvement by Multi-Site SOTF Implementation

Calvin Yang, NXP; Bryan Lee, Advantest

Intercontinental 5 - 4:15 PM Friday


The main test stages in mass production are final testing and quality assurance. This paper presents how to automatically implement sampling on the fly (SOTF) for QA during final testing. Benefits include reduced operation time, faster transportation time for devices on the handler and improved test efficiency.

V93000-114-IT - High Parallelism Probe Card on V93000 Direct Dock System to Increase Testing Throughput on Automotive

Johann Heitzer, Way Jam Chen and Norbert Effenberg, Infineon; Alexander Z'endorf and Peter Hirschmann, Advantest; Alan Liao and Patrick Phipps FormFactor

Intercontinental 5 - 2:15 PM Friday


As automotive IC fabrication transitions to sub-40nm processes on 12-inch wafers, customers are exploring more efficient test solutions to accommodate the increased number of die per wafer. FormFactor and Advantest have collaborated to develop FFI TrueScale Matrix products on the V93000 direct dock system to enable parallel testing of up to 128 DUTs over a 170C temperature range.


V93000-158-IT - Inertial Sensor Test on V93000

Sven Lotterer, Bosch

Intercontinental 4 - 11:25 AM Friday


Final testing of MEMS is a very special branch of IC testing, normally involving special handlers, high site counts and special test processes. This paper shows how to bring MEMS inertial sensor ICs to high-volume manufacturing including testing specifics and test-time reduction steps used to meet production requirements.

V93000-198-IT - Automatic Multi-Site Efficiency Monitor with SmarTest Production Datalog

Corey Liu and Johnny Cheng, nVidia

Intercontinental 5 - 1:30 PM Friday


This paper discusses a tool to automatically monitor multi-site efficiency (MSE) by periodically checking SmarTest datalog files during production. This ensures that whenever updated test methods are adopted for production, multi-site efficiency is not lost accidentally.

New Hardware/Software Test Solutions

 

V93000-99-NTS - Comprehensive Asset Management Solution Across Upstream to Downstream in EM360

Jing Wang, Xiaoqing Liu, Allen Wang, and Xuejian Li, Advantest; Yuxiang Tian, Spreadtrum; Brian Li, Huatek

Intercontinental 5 - 11:25 AM Friday


As a test-floor software solution, EM360 provides many powerful features for asset management including board utilization, license utilization and board summary. A cross network capability helps upstream users to monitor and consign testers downstream, improving equipment utilization as well as time to market.

V93000-171-NTS - Quick Identification and Prevention of Harmful States in Test Program

Andreas Ruf and Thomas Shi, Advantest; Hari Prasad, Infineon Technologies

Intercontinental 5 - 3:30 PM Friday


Advantest's TP360 release checker tool helps to identify and prevent real and potentially harmful states in a test program. New enhancements support power instruments such as AVI64 and PVI8, pattern-based test programs, loadboard relays and PMUX.


V93000-207-NTS - A Case Study of an AP-BB Device Conversion to SmarTest8

Michael Daub, Tong Li and Ho-Kok Gho, Advantest

Intercontinental 2 - 4:15 PM Friday


AP-BB device test programs can be converted from SmarTest7 to SmarTest8. This paper describes aspects such as adapting to new SmarTest8 concepts, automated set-up conversion using the TACO tool as well as implementing different IP blocks with SmarTest8's features and instruments.

Product Engineering

V93000-159-PE - V93000 Pattern Generator for SmartRDI

Dong-Myong Kim, Bernd Reiter and Rose Hu, Advantest

Intercontinental 4 - 2:15 PM Friday


ATE systems' ability to balance flexibility in engineering and stability in production is very important. This paper introduces a new customized tool that generates a production program package, including all SmartRDI patterns required, from an engineering test program.


Reducing Time to Market

 

V93000-47-RTTM - A Novel Automatic Test Program Generation ToolBased on Standardized Device Test Plan

Jimmy Sun and Zhiyuan Wang, Advantest

Intercontinental 4 - 3:30 PM Friday


This paper introduces a novel, cloud-based automatic test program generation (ATPG) tool that provides a standardized device test plan format for both DFT engineering and ATE production testing, built-in ATE optimized programming approaches and flexible and extendable tool interfaces for customization requests.

T2000-123-RTTM - Achieve the Highest Efficiency for SmartCard and Embedded Memory Verification and Production Development

Ke Zhang, Advantest

Intercontinental 1 - 2:15 PM Friday


An engineering system for fabless SmartCard verification and production development has been configured. This paper explains the multi-user development guidelines, verification and production module configuration, multi-user loadboard design and software.

V93000-136-RTTM - Database Organized DC Settings for DC Scale/Power and Digital Instruments

Georg Daler, Infineon Technologies; Jiamin Wang and Erhard Schuetz, Advantest

Intercontinental 3 - 4:15 PM Friday


The paper introduces database-oriented DC settings in sequence-based test program development. It shows an automotive application as well as how DC settings from AVI64, DPS128 and PPMU are organized, managed, used and maintained in SmartRDI-based test program development.


Test Methodologies

 

V93000-45-TM - The Evolutionary Monitoring Algorithms Under Device DC Parameter Testing

Kun Xu, Advantest; Yuxiang Tian, Spreadtrum

Intercontinental 3 - 3:30 PM Friday


The importance of PMIC testing has become more and more obvious. To examine the influence of outside factors, this paper assigns a testing process as a growth model and uses evolutionary algorithms (EAs) to monitor and perform real-time analysis on the test results of a PMIC's DC parameters. This approach can improve test stability and reduce the cost of test.


 

V93000-132-TM - Coplanar Waveguide On-Wafer Calibration Technology to Enable V93000 for Volume Microwave On-Wafer Test

Yuzhe Yin, China Electronics Standardization Institute

Intercontinental 2 - 11:25 AM Friday


Microwave power amplifiers such as GaAs/GaN can operate at 40 GHz and beyond. A GaAs calibration standard chip has been developed to provide SOLT and TRL calibration cells covering 40 GHz. VSWR and insertion loss verification cells also are included.

V93000-148-TM - A Novel UDI Implementation of Jitter Separation and Eye Test with Coherent Sampling

Yeqing Wang, Kenichi Nagatani, Zhijian Yi,

Intercontinental 1 - 11:25 AM Friday


On the V93000 platform, currently UDI is the exclusive solution for high-speed testing of devices with data rates higher than 16 Gbps. This presentation introduces a new implementation of jitter separation and eye test by coherent sampling with UDI.

Other Advantest Platforms-205-TM - T5851-UFS Memory System-Level Testing

Daisuke Takaoka, Advantest

Intercontinental 1 - 3:30 PM Friday


T5851 is an at-speed system-level testing solution. This paper discusses the benefits of system-level testing on the T5851 for UFS2.0 and UFS2.1 standards including powerful testing features and how the device interface provides an ideal testing environment.

Other Advantest Platforms-206-TM - T58XX NAND Production Solution

Hajime Honda, Advantest

Intercontinental 1 - 4:15 PM Friday


Advantest provides several types of NAND flash testing solutions for use in engineering and production. This paper introduces a solution for each device as eMMC/Toggle NAND/ONFi.