Technology Kiosk Showcase 2024
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TECHNOLOGY KIOSK TITLES
ACS Real-Time Data Infrastructure (RTDI)
Ken Butler and Julie DiBene, Advantest
Experience the Power of Predictive Binning
Lisa Taubensee, Advantest
Advantest Talks Semi
Keith Schaub and Nadine Schill, Advantest
M4171 Handler Delivers Efficiency, Cost and Time-to-Market Advantages
Yoshinori Ueno and Yoshiki Baba, Advantest
Probing Challenges on High-Power Discrete SiCs
Adriano Mancosu, CREA - Advantest Group
System-Level Test Using a Closed-Loop, Fan-Cooled Thermal System
Jess Gillespie and Houman Rokni, Advantest
Advanced Parallel Micro/Mini LED Testing Solutions
Pedersen Karl and Koji Miyauchi, Advantest
Driving the Future: Cutting-Edge MIPI A-PHY Testing Solutions for Autonomous Vehicles
Koji Miyauchi and Hiroyasu Kondo, Advantest
Automated Optical Inspection: Socket Vision and Fast-Track AI/ML Model Development
Vijayakumar Thangamariappan, Advantest
Atsushi Konno, Advantest
Passive Optical Alignment Wafer Test for Silicon Photonics Applications
Hubert Werkmann, Advantest
Pin Scale Multilevel Serial – Next-Generation High-Speed ATE Instrument
Andreas Harder, Advantest
SmartBurst: Combining Performance, Debuggability and Observability
Sebastian Wagner, Advantest
Next-Generation Controller Platform to Optimize Test Efficiency and Productivity
Puneetha Rajashekar, Advantest
Spectrum Mask Measurement Using Advantest V93000
Max Seminario, Advantest
Synopsys Path Margin Monitor for Silicon Lifecycle Management
Mohsin Ali, Advantest
Latest SmarTest 8 Setup/Debug Tools and Future AR capabilities
Rowena Xu, Advantest
Addressing High Probe-Needle Count in High-Volume Manufacturing
Steffen Baier, Advantest
ATE Interface and Interconnect Solutions
Bassam Asfoor, R&D Altanova, Advantest Group