Technology Kiosk Showcase 2025
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TECHNOLOGY KIOSK TITLES
Pin Scale 5000 Protocol Link: A Hardware-Integrated Protocol Interface for Device Communication
Angelo Zucchetti, Advantest
M4171 Single-Site Pick-and-Place Handler and HA1200 Die Level Prober
Yoshinori Ueno and Yoshiki Baba, Advantest
Mark Nagel, Advantest
Optimizing and Simplifying System Diagnostics Using the Universal Diagnostic Interface Board
Steffen Baier and Frank Mielke, Advantest
ATE Interface and Interconnect Solutions
Bassam Asfoor, R&D Altanova, Advantest Group
Enhancing Productivity with AI-Driven Information Retrieval for V93000
Harald Hermann, Advantest
SiConic: A Scalable Solution for Automated Silicon Validation
Adir Zonta, Advantest
EXA Scale MultiLane Extension: Addressing 224G Data Center I/O
Michael Daub and Daniel Simoncelli, Advantest
XHC32 Advanced Contact Protection
Brent Bullock, Advantest
T2000 RDK Debug Navigator
Makoto Kuzuoka, Advantest
Testing of Co-Packaged Optics and Silicon Photonics Devices in HVM
Natan Chejanovsky and Roger Nettles, Advantest
Advantest Talks Semi
Don Ong and Nadine Schill, Advantest
HRP-UWB Testing Using Wave Scale RF20ex
Khaled Ben-Fatma, Advantest
Wave Scale RF20ex: Next-Generation RF ATE Ready for Wi-Fi 7, 6G and UWB
Aether Lee, Oscar Solano and Illya Stepanov, Advantest
ACS Real-Time Data Infrastructure (RTDI)
Julie DiBene, Advantest
PMUX02 and Routing Tools: Transforming Complexity into Opportunity
Andreas Ruf, Advantest
New Capabilities for Interactive Debugging in SmarTest 8
Michael Vogt, Advantest
New UI Tools for T2000 ISS Solution
Takehisa Yoda, Advantest
Applied Research and Venture Team (ART): The Future of Test
Amit Kucheriya and Nadine Schill, Advantest
High-Speed SCAN on standard tester channels
Michael Braun, Advantest
Code Gen AI – Redefining the Future of Test Program Development with Generative AI on V93000
Mykola Zakharchuk, Advantest