Best Paper Awards

Predictive Test Selection for Silicon at System Level Using Machine Learning and Cloud Services Artificial Intelligence​

Ritesh Mehta - NVIDIA

 

Leveraging Generative AI for Domain-Specific Knowledge Retrieval and Interaction Artificial Intelligence

Navnath Raut - Advantest

 

Honorable Mentions

Left-Shifting Functional Validation to Wafer Sort Test Methodologies

Anik Mehta - Microsoft

Phil Brock - Advantest

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Vmin to the Max: A New Approach to Single-Sequencer Run Searching Test Methodologies

Michael Kozma, Juergen Sang, Alex Perlman, Benny Wang - Advantest

 

Best Kiosk Award

Advantest Talks Semi

Nadine Schill, Keith Schaub, Don Ong – Advantest

 

Visionary Award

Kar Leong - Qualcomm