Workshop Day

May 21, 2026: 9:00 AM – 4:00 PM

Deepen your expertise with hands-on workshops led by Advantest engineers and industry experts. Workshop Day offers practical, intensive sessions to develop your skills on Advantest platforms.

About Workshop Day

Workshop Day provides an opportunity for in-depth learning beyond the main conference program. These focused sessions allow you to work directly with tools and technologies in a collaborative environment.

Whether you’re new to Advantest platforms or looking to advance your expertise, Workshop Day sessions are designed to provide practical, applicable skills you can use immediately.

What to Expect

  • Hands-on Training – Work directly with Advantest hardware and software
  • Expert Instruction – Learn from experienced Advantest engineers
  • Small Group Sessions – Personalized attention and Q&A opportunities
  • Practical Skills – Take away techniques you can apply immediately
  • Networking – Connect with peers working on similar challenges

Registration

Workshop Day sessions require separate registration. Space is limited to ensure a quality learning experience for all participants. Register now to secure your spot.

Register for Workshop Day

Workshop Topics

Select from four focused workshops covering RF testing, power design, platform integration, and machine learning for semiconductor test.

Wave Scale RF20ex RF Test Methodologies

Wave Scale RF20ex (WSRF20ex) is Advantest’s next-generation RF instrument for the V93000 EXA Scale platform, engineered to deliver industry-leading 2 GHz modulation bandwidth, continuous frequency coverage up to 20 GHz, and unmatched port density (64 bidirectional RF ports per card). Its Direct RF architecture, dual-measure, and integrated VNA up to 20 GHz enable high-volume production with high site-count, addressing today’s Wi-Fi 7/8, 5G FR1/FR3, UWB (including emerging 802.15.4ab), GNSS, BT/BLE and future standards with a single scalable solution.

This workshop will focus on reviewing the hardware architecture of WSRF20ex and share best practices for programming to obtain the best performance for both narrowband and wideband stimulus and measurement conditions.

Key Topics:

  • Introduction of WSRF20ex ATE test solution
  • Comparison of Direct RF vs. Heterodyne architectures
  • Overview of key hardware features of WSRF20ex
  • Overview of key software features of WSRF20ex
  • Hands-on Java programming example implementation

Additionally: access to Advantest domain experts and example implementations.

V93000 High Performance Computation Power Design Methodologies and Practices

The ongoing scaling of designs to address Machine Learning (ML), Artificial Intelligence (AI) and high site count Application Processors leads to challenges in meeting the practical implementation of power requirements for device testing.

This High-Performance Computation (HPC) workshop will focus on sharing methodologies and best practices for addressing the power supply design, component selection, DPS regulation tuning, power/thermal monitoring and DUT Board PCB (Probe and Package Test) thermal control.

Key Topics:

  • Observability and regulation of power domains of high current, high pin count, high core count and large gate array devices
  • Matching regulation of ATE power to dynamic device load conditions
  • Device interface protection to mitigate probe tip and contactor burn
  • PCB design processes and techniques to ensure optimal power delivery to Device Under Test
  • Addressing High Voltage supply requirements for regulator integrated devices

Additionally: access to Advantest domain experts and example implementations.

How to Leverage AutoML to Accelerate ML Integration into Semiconductor Testing

Machine Learning (ML) offers powerful solutions to detect anomalies, predict failures, and optimize test strategies. However, integrating ML into semiconductor testing workflows can be challenging due to the need for specialized data science expertise, lack of unified ML tooling, and the difficulty of scaling models across diverse test environments.

This workshop will focus on how Automated Machine Learning (AutoML) can streamline the integration of machine learning into semiconductor testing by reducing development time, lowering the expertise barrier, and enabling scalable, data-driven test strategies. Participants will explore practical applications of AutoML—such as data ingestion, feature engineering, model search and optimization—while learning best practices to accelerate innovation and facilitate ML workflows in semiconductor testing.

Key Topics:

  • Overview of AutoML: what it is and how it differs from traditional ML approaches
  • Core components of AutoML for semiconductor testing: automated data preprocessing and feature engineering, model selection and hyperparameter optimization, automated model evaluation and benchmarking
  • Best practices and pitfalls: ensuring data quality and representativeness, monitoring and maintaining deployed models
  • Adaptive test loop and continuous learning leveraging production data

Additionally: access to Advantest domain experts and example implementations.