Technology Kiosks

VOICE 2017 will feature an expanded Technology Kiosk Showcase in both Palm Springs and Shanghai.

Technology Kiosk Showcase – VOICE U.S.

Kiosk 01 – True Parallel Mixed-Signal Testing with Wave Scale MX

Rainer Held and Tong Li, Advantest

The Wave Scale MX card and SmarTest 8 software enable testing for ADC and DAC applications. This presentation covers how to set up a device and debugging steps from TestFlow and TestSuite to the code level.

Kiosk 02 – SmarTest 8 Manufacturing Integration

Pierre Gauthier and Vincent Chu, Advantest

A new manufacturing integration solution enabled by SmarTest 8 will be introduced. Its three major components are a new TC API, a new recipe and a new easy-to-use test cell control tool (TCCT). Use cases will be demonstrated in the kiosk.

Kiosk 03 – Wave Scale RF: Software Usability and Throughput

Oscar Solano, E.K. Tan and Frank Goh, Advantest

Wave Scale RF is the latest RF test solution on the V93000. This kiosk will showcase the solution, focusing on its integration into SmarTest 8. Different cross-domain tools will be presented, where Wave Scale RF is represented together with all other domain instruments. The inherent multi-site and background structure will be introduced and the new TestSuite shmoos will be demonstrated.

Kiosk 04 – Reducing Cost of Test and Loadboard Complexity Using the AVI64 Universal Pin

Kent Luehman and Yaojuan Xu, Advantest

By showing a real x16 set-up of a highly integrated power/analog device, this kiosk demonstrates how the AVI64 Universal Analog Pin can be used to maximize site count and minimize cost of test. Come see a real loadboard design showing the reduced complexity and take a look at the test program to highlight the straightforward coding enabled by the universal pin concept.

Kiosk 05 – New Capabilities of the SmarTest 7.4 Release Stream

Michael Schwarz and Christian Rost, Advantest

The SmarTest 7.4 release provides many new capabilities to address high site count and increase MSE and throughput. The kiosk will highlight new features of SmarTest 7.4 including the improved site control GUI addressing high-site-count applications and immediate uploading of captured data.

Kiosk 06 – SmarTest 8 Protocol Aware

Michael Minnerop, Advantest

SmarTest 8 has a fully integrated protocol-aware solution with set up, execution and debugging using the same concepts and the same tools as all other instruments on the V93000 test system. Protocol-aware transactions are fully synchronized with all other ATE instruments. Several use cases will be shown.

Kiosk 07 – Advanced Capabilities of the Device Characterization Solution in SmarTest 8

Wen-Jing Song, Advantest

This kiosk introduces advanced capabilities of the characterization solution in SmarTest 8 with application demonstrations. Both interactive debugging and volume execution in flow usage will be shown, including the ease of RF/mixed-signal characterization and the efficiency of setting up shmoo over a whole flow, with no more than 10 lines of coding.

Kiosk 08 – Wave Scale RF: Hardware Overview and Performance

Joe Kelly, Edwin Lowery and Frank Goh, Advantest

Wave Scale RF is the latest RF test solution on the V93000. This kiosk will show the block diagram for this new instrument, explaining how it works and the flexibility it provides. Density has greatly increased and the efficiency of pin use has jumped. Basic system specifications will be discussed along with real-world throughput and measurement results. The hardware will be shown.

Kiosk 09 – UDI: The Advantest Millimeter Wave and HSIO Add-On Instruments

Gianluca Lombardi, Advantest

Advantest offers a production-proven V93000 SoC high-end add-on instrument that meets the most advanced engineering and HVM test needs beyond the typical ATE space and reach: the UDI or Universal Device Interface. Two different types of UDIs serve high-speed digital and millimetre-wave applications, respectively, extending the V93000’s SoC capabilities beyond PSSL for digital and PSRF for RF.

Kiosk 10 – SmartRDI: Pattern-Based Test Programming Interface on SmarTest 7

Ge Liang, Advantest

SmartRDI has become the standard approach in pattern-based test programming on SmarTest 7. It allows users to focus on test method coding instead of GUI set-ups or generation tools. New SmartRDI features including PMUX/utility control, result emulation, hidden vector updates and immediate data uploading further improve usability and throughput.

Kiosk 11 – Wave Scale RF: An Extensible Architecture Prepared for the Future

Edwin Lowery, Advantest

Wave Scale RF, the latest RF instrument set on the V93000, is more than a state-of-the-art solution for testing the latest RF trends. It can be extended into additional application spaces. Whether your interest is characterization or high-speed production, come see how the Wave Scale RF can cover WiGig, 5G and more.

Kiosk 12 – Using the SmarTest 8 Operating Sequence

Horst Lehner, Advantest

The SmarTest 8 operating sequence offers test engineers uniquely new synchronization of instruments across different domains including digital, DC, baseband and RF. This kiosk gives you a hands-on look at the operating sequence and its building blocks as well as the opportunity to learn how you can use these to improve development productivity and execution throughput.

Kiosk 13 – PowerMUX Routing Tool for Enhanced Usability

Toni Dirscherl and Derek Floyd, Advantest

The increasing number of I/O pins from power/analog devices and the demand for more test sites often requires sophisticated multiplexing schemes. The PowerMUX card can reduce loadboard complexity for such applications. Underlying software automatically generates the required control pattern for efficient sequencer-based execution of various user scenarios.

Kiosk 14 – CloudTestingTM Service for Failure Analysis

A.T. Sivaram, Advantest

Instead of buying and maintaining or renting expensive test equipment, CloudTestingTM Service (CTS) allows a user to sign up for a test service, then download test IPs and use them for silicon debugging. The user is billed each month for the IPs used. The test equipment for executing test algorithms, a compact desktop unit, is provided for the duration of the service.

Kiosk 15 – EVA100 Production Worthiness

Anthony Lum, Kotaro Hasegawa and Shenqi Cai, Advantest

The EVA100, a proven solution to release products in less than a month, delivers sub-second test times for analog device production. The kiosk will demonstrate EVA100’s easy-to-use GUI with production-worthy examples for linear analog device functions. A case study featuring Anora Labs’ services will be given.

Kiosk 16 – Advantest’s High-Performance SoC and Memory Handlers

Zain Abadin and Yoshinori Ueno, Advantest

Advantest has pick-and-place handlers to accommodate customers’ various needs including a high-performance unit for high-end devices, a high-throughput and low-cost system for low-end devices and a single-site handler for laboratory use. Features include technologies such as Active Thermal Control (ATC) and on-the-fly Vision Alignment (VA) to increase test yields and reduce time to market.

Kiosk 17 – HA1000 Die-Level Handler

Dave Armstrong, Advantest

The revolutionary HA1000 handler probes bare die after thinning, bumping and dicing. This allows users to find known good die so that expensive packages and good 2.5D/3D assemblies are not scrapped after putting marginal devices on them. The HA1000 catches both assembly-induced defects and thermally induced failures.

Kiosk 18 – T2000: TSS R3.07 New Features

Derek Wu and Ke Zhang, Advantest

This kiosk presents major enhancements in the latest TSS R3.07 software including a test condition optimizer and pattern load-time optimization, new debugging GUIs and multiple-site controller synchronizations.

Kiosk 19 – An Optical Test Fixture Technology for High-Volume Optical Transceiver Manufacturing

Hiroyuki Mineo, Advantest

A key requirement for optical connectors and sockets is high durability in a high-volume test environment. The insertion loss variation of the connector will degrade yield and shorten lifetime, resulting in a much higher operational cost. To solve this problem, an optical test fixture technology with repeated measurement performance to more than 100,000 cycles has been developed.

Kiosk 20 – Low-Cost 4G LTE System and Functional Test Set for the IoT Market

Ira Leventhal, Advantest

As the market proliferates with IoT products and new 5G standards, the need for low-cost test systems is increasing. W2BI’s Micro Line Test Platform tackles this challenge with support for multi-band LTE, WiFi and BT, small footprint, low cost for multi-site distribution, testing of up to 32 smart devices and cloud-based test/report management.

Technology Kiosk Showcase – VOICE China

Kiosk 01 - True Parallel Mixed-Signal Testing with Wave Scale MX

Rainer Held and Tong Li, Advantest

The Wave Scale MX card and SmarTest 8 software enable testing for ADC and DAC applications. This presentation covers how to set up a device and debugging steps from TestFlow and TestSuite to the code level.

Kiosk 02 - Reducing Cost of Test and Loadboard Complexity Using the AVI64 Universal Pin

Kent Luehman and Liang Li, Advantest

By showing a real x16 set-up of a highly integrated power/analog device, this kiosk demonstrates how the AVI64 Universal Analog Pin can be used to maximize site count and minimize cost of test. Come see a real loadboard design showing the reduced complexity and take a look at the test program to highlight the straightforward coding enabled by the universal pin concept.

Kiosk 03 - Advanced Capabilities of the Device Characterization Solution in SmarTest 8

Wen-Jing Song, Advantest

This kiosk introduces advanced capabilities of the characterization solution in SmarTest 8 with application demonstrations. Both interactive debugging and volume execution in flow usage will be shown, including the ease of RF/mixed-signal characterization and the efficiency of setting up shmoo over a whole flow, with no more than 10 lines of coding.

Kiosk 04 - Wave Scale RF: Hardware Overview and Performance

Joe Kelly, Edwin Lowery and Frank Goh, Advantest

Wave Scale RF is the latest RF test solution on the V93000. This kiosk will show the block diagram for this new instrument, explaining how it works and the flexibility it provides. Density has greatly increased and the efficiency of pin use has jumped. Basic system specifications will be discussed along with real-world throughput and measurement results. The hardware will be shown.

Kiosk 05 - VGEM: Enable Factory Automation Through the SECS-GEM Protocol

Xiaoyue Wang, Advantest

High-volume manufacturing requires complex computer integrated manufacturing (CIM) environments. SEMI Equipment Communications Standard/Generic Equipment Model (SECS/GEM) is a communication and control protocol enabling host control design to be leveraged across a wide range of semiconductor equipment. This kiosk features a demonstration using Advantest’s VGEM interface.

Kiosk 06 - EVA100 Production Worthiness

Anthony Lum, Kotaro Hasegawa and Shenqi Cai, Advantest

The EVA100, a proven solution to release products in less than a month, delivers sub-second test times for analog device production. The kiosk will demonstrate EVA100’s easy-to-use GUI with production-worthy examples for linear analog device functions. A case study featuring Anora Labs’ services will be given.

Kiosk 07 - T2000: TSS R3.07 New Features

Derek Wu and Ke Zhang, Advantest

This kiosk presents major enhancements in the latest TSS R3.07 software including a test condition optimizer and pattern load-time optimization, new debugging GUIs and multiple-site controller synchronizations.

Kiosk 08 - Advantest Memory Test Solutions

Hajime Honda, Advantest

To address the growing memory-chip industry and testing needs in China, Advantest offers its T5000 series. These include DRAM test solutions from wafer test using the T5800 series, package test with the T5503 series, Flash test solutions from wafer/package test on the T5800 series and system-level test solutions for UFS using the T5851.

Kiosk 09 - Loadboard Design Technologies

Hiromitsu Takasu and Wei Wei, Advantest

This kiosk contains exhibits of loadboad design technology. Advanced simulation, component evaluation (e.g., high-speed relays) and the evaluation of new board material will be shown. Also on display will be a V93000 evaluation board that includes the newest relay technology, board material (Megatron 7) and high-speed transmission lines up to 32 GHz.